| 000 | 00921cam a22002774a 4500 | ||
|---|---|---|---|
| 005 | 20160107130310.0 | ||
| 008 | 050902s2007 nyua b 001 0 eng c | ||
| 020 | _a9780387292601 (hbk.) | ||
| 020 | _a0387292608 (hbk.) | ||
| 020 | _a0387292616 (ebook) | ||
| 020 | _a9780387292618 (ebook) | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.38152 _bALF |
| 100 | 1 |
_aAlford, Terry L. _96989 |
|
| 245 | 1 | 0 |
_aFundamentals of nanoscale film analysis / _cTerry L. Alford, Leonard C. Feldman and James W. Mayer. |
| 250 | _a1st ed. | ||
| 260 |
_aNew York, _aLondon : _bSpringer _c2007. |
||
| 300 | _axiv, 336p. | ||
| 650 | 0 |
_aThin films. _96990 |
|
| 650 | 0 |
_aNanostructured materials. _96991 |
|
| 700 | 1 |
_aFeldman, Leonard C. _96992 |
|
| 700 | 1 |
_aMayer, James W. _96993 |
|
| 856 | 4 | 1 | _uhttp://www.loc.gov/catdir/toc/fy0713/2005933265.html |
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0824/2005933265-d.html |
| 942 | _cBK | ||
| 999 |
_c29111 _d29111 |
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