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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New York, London : Springer 2007.Edition: 1st edDescription: xiv, 336pISBN:
  • 9780387292601 (hbk.)
  • 0387292608 (hbk.)
  • 0387292616 (ebook)
  • 9780387292618 (ebook)
Subject(s): DDC classification:
  • 621.38152 ALF
Online resources:
List(s) this item appears in: RC142 Nanoscience 28603 TO 28697
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Central Library General Section 621.38152 ALF (Browse shelf(Opens below)) Available 028662
Books Books Central Library General Section 621.38152 ALF (Browse shelf(Opens below)) Available 028664
Books Books Central Library General Section 621.38152 ALF (Browse shelf(Opens below)) Available 028663

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