Scanning probe microscopy : atomic scale engineering by forces and currents / by Adam S Foster .
Material type:
TextPublication details: Germany Springer Verlag Berlin Heidelbeng 2006Edition: 1st edDescription: v,250p.: 22cmISBN: - 9780387400907(hb)
- 502.82 FOS
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Central Library General Section | 502.82 FOS (Browse shelf(Opens below)) | Available | 026193 |
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| 502.285 ECH Handboolk of sample preparation for scanning electron microscopy and x ray microanalysis | 502.3 JAN Developing a talent for science | 502.8 KOH Lords of the fly : | 502.82 FOS Scanning probe microscopy : | 502.82 HAW Science of microscopy Vol.1 | 502.82 HEA Dictionary of Microscopy : | 502.825 CHE Introduction to scanning tunneling microscopy / |
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