Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / by Sergei Kalinin and Alexei Gruverman .
Material type:
TextPublication details: New York Springer Science Business Media 2007Edition: 1st edDescription: ix, 979p. : 25cmISBN: - 9780387286679(Hb)
- 502.825 KAL
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Central Library General Section | 502.825 KAL (Browse shelf(Opens below)) | Available | 023826 |
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| 502.82 HAW Science of microscopy Vol.1 | 502.82 HEA Dictionary of Microscopy : | 502.825 CHE Introduction to scanning tunneling microscopy / | 502.825 KAL Scanning probe microscopy : | 502.825 KAL Scanning probe microscopy : | 502.825 NEW Advanced scanning electron microscopy and xray microanalysis | 502.825 PRU Scanning auger electron microscopy |
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