Normal view MARC view ISBD view

Fundamentals of nanoscale film analysis /

Alford, Terry L.

Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. - 1st ed. - New York, London : Springer 2007. - xiv, 336p.

ISBN: 9780387292601 (hbk.) 0387292608 (hbk.) 0387292616 (ebook) 9780387292618 (ebook)

Subjects--Topical Terms:
Thin films.
Nanostructured materials.

Dewey Class. No.: 621.38152 / ALF

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARC (non-Unicode/MARC-8) MARCXML MODS (XML) RIS MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)